THEME: "Current and Emerging Trends in Materials Research and Engineering"
Department of Materials Science and Engineering, The University of Texas Arlington, USA
Title: Dr
Dr. Jiechao Jiang is a Professor
of Research in the Department of Materials Science and Engineering at the
University of Texas at Arlington and the facility manager of the UTA Characterization
Center for Materials and Biology. Dr. Jiang received his Ph.D. in 1993 from the
University of Science and Technology Beijing and the Beijing Laboratory of
Electron Microscopy, Chinese Academy of Science. Dr. Jiang he has worked at
Louisiana State University (Baton Rouge, Louisiana), University of Michigan
(Ann Arbor, Michigan), University of Marburg (Germany) and Stockholm University
(Sweden). Dr. Jiang has more than thirty years of experience in the field of
electron microscopy and microanalysis. He has extensive expertise of most
electron microscope techniques and tremendous experience in surface analysis.
Dr. Jiang has published about 200
referred journal articles on the advance materials including quasicrystals, minerals,
semiconductor and ceramic oxide thin films, surface modified materials,
multifunctional hard coatings and nanostructured materials. Dr. Jiang’s research
interests:
• Materials characterization
using AFM, analytical TEM, high Resolution TEM, in-situ TEM, SEM, XRD, Auger,
XPS, and TGA/DSC, etc.
• Microstructures
and defects of advanced functional materials and minerals, atomic structure
modeling for new phases and interfaces, electron crystallographic image
processing and image simulation.
• Atomistic structure of multi-layer and
film/substrate interfaces of epitaxial thin films.
• Self-assembled nanostructures for
nano-electronic and opto-electric devices, and nano fuel cells.
• Processing, microstructures, and property
relationships in micro/nano-scale materials (thin films, coatings, surface
layers and nanomaterials).
• Nucleation, growth mechanisms, interface
structures and surface morphologies, structural modeling and simulation of
epitaxial thin films, transition metal-based multifunctional hard coatings.
Materials characterization using AFM, analytical
TEM, high Resolution TEM, in-situ TEM, SEM, XRD, Auger, XPS, and TGA/DSC, etc